- 系列 :
- 工作温度 :
- 供电电压 :
- 逻辑类型 :
-
- 8-Bit to 9-Bit Parity Bus Transceiver (1)
- Arithmetic Logic Unit (3)
- Driver/Receiver (2)
- Scan Test Device with Buffers (2)
- Scan Test Device with Bus Transceivers (2)
- Scan Test Device with D-Type Edge-Triggered Flip-Flops (2)
- Scan Test Device with D-Type Latches (1)
- Scan Test Device with Inverting Buffers (2)
15 产品
| 图片 | 型号 | 价格 | 数量 | 库存 | 制造商 | 描述 | 系列 | 零件状态 | 包装材料 | 工作温度 | 安装类型 | 包装/箱 | 供应商设备包 | 供电电压 | 位数 | 逻辑类型 | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
|
获得报价 |
3,466
有现货
|
ON Semiconductor | IC ARITHMETIC LOGIC 4BIT 24-DIP | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 4 | Arithmetic Logic Unit | ||
|
|
|
获得报价 |
1,666
有现货
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | ||
|
|
|
获得报价 |
1,188
有现货
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | ||
|
|
|
获得报价 |
806
有现货
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | ||
|
|
|
获得报价 |
846
有现货
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
获得报价 |
3,810
有现货
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
获得报价 |
2,817
有现货
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | ||
|
|
|
获得报价 |
2,739
有现货
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | ||
|
|
|
获得报价 |
3,609
有现货
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | ||
|
|
|
获得报价 |
2,795
有现货
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | ||
|
|
|
获得报价 |
3,663
有现货
|
Texas Instruments | IC TRANSCEIVER 1-9BIT 24DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | ||
|
|
|
获得报价 |
2,075
有现货
|
Texas Instruments | IC ARITHMETIC LOGIC UNIT 24DIP | 74AS | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | - | Arithmetic Logic Unit | ||
|
|
|
获得报价 |
3,881
有现货
|
Texas Instruments | IC ARITHMETIC LOGIC UNIT 24DIP | 74AS | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | - | Arithmetic Logic Unit | ||
|
|
|
获得报价 |
3,026
有现货
|
ON Semiconductor | IC DRIVER/RCVR QUAD BUS 24-DIP | 10H | Obsolete | Tube | 0°C ~ 75°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | - | 4 | Driver/Receiver | ||
|
|
|
获得报价 |
3,483
有现货
|
ON Semiconductor | IC DRIVER/RCVR QUAD BUS 24-DIP | 10H | Obsolete | Tube | 0°C ~ 75°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | - | 4 | Driver/Receiver |
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