- 逻辑类型 :
-
- 8-Bit to 9-Bit Parity Bus Transceiver (1)
- Arithmetic Logic Unit (8)
- BCD to Decimal Decoder/Driver (1)
- Binary Full Adder (2)
- Binary Full Adder with Fast Carry (8)
- Binary Rate Multiplier (2)
- Buffer/Driver with Parity (1)
- Bus Arbiter (1)
- Delay Element (1)
- Digital Phase-Locked-Loop Filters (1)
- Look-ahead Carry Generator (2)
- Programmable Frequency Dividers/Digital Timers (2)
- Scan Test Device with Buffers (2)
- Scan Test Device with Bus Transceivers (2)
- Scan Test Device with D-Type Edge-Triggered Flip-Flops (2)
- Scan Test Device with D-Type Latches (1)
- Scan Test Device with Inverting Buffers (2)
- Schottky Barrier Diode Bus-Termination Array (6)
46 产品
| 图片 | 型号 | 价格 | 数量 | 库存 | 制造商 | 描述 | 系列 | 零件状态 | 包装材料 | 工作温度 | 安装类型 | 包装/箱 | 供应商设备包 | 供电电压 | 位数 | 逻辑类型 | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
|
获得报价 |
2,160
有现货
|
NXP USA Inc. | IC BUFFER/LDRIVER OCTAL 24-DIP | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-DIP | 4.5 V ~ 5.5 V | 8 | Buffer/Driver with Parity | ||
|
|
|
获得报价 |
3,466
有现货
|
ON Semiconductor | IC ARITHMETIC LOGIC 4BIT 24-DIP | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 4 | Arithmetic Logic Unit | ||
|
|
获得报价 |
1,638
有现货
|
ON Semiconductor | IC ARITHMETIC LOGIC 4BIT 20-DIP | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 20-DIP (0.300", 7.62mm) | 20-PDIP | 4.5 V ~ 5.5 V | 4 | Arithmetic Logic Unit | ||
|
|
|
获得报价 |
803
有现货
|
ON Semiconductor | IC ARITHMETIC LOGIC 4BIT 20-DIP | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 20-DIP (0.300", 7.62mm) | 20-PDIP | 4.5 V ~ 5.5 V | 4 | Arithmetic Logic Unit | ||
|
|
获得报价 |
2,234
有现货
|
ON Semiconductor | IC FULL ADDER BINARY 4BIT 16-DIP | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-DIP | 4.5 V ~ 5.5 V | 4 | Binary Full Adder with Fast Carry | ||
|
|
|
获得报价 |
3,911
有现货
|
ON Semiconductor | IC GENERATOR LOOKAHEAD 16-DIP | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-DIP | 4.5 V ~ 5.5 V | 4 | Look-ahead Carry Generator | ||
|
|
获得报价 |
3,476
有现货
|
ON Semiconductor | IC ARITHMETIC LOGIC 4BIT 24-DIP | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.600", 15.24mm) | 24-PDIP | 4.5 V ~ 5.5 V | 4 | Arithmetic Logic Unit | ||
|
|
获得报价 |
1,319
有现货
|
ON Semiconductor | GPIB COMPATIBLE OCTAL TRANSCEIV | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-DIP | 4.5 V ~ 5.5 V | 8 | - | ||
|
|
|
获得报价 |
1,619
有现货
|
ON Semiconductor | IC ADDER BCD 4BIT 16-DIP | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-DIP | 4.5 V ~ 5.5 V | 4 | Binary Full Adder | ||
|
|
|
获得报价 |
3,356
有现货
|
ON Semiconductor | IC ADDER BIN W/CARRY 4BIT 16-DIP | 74S | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-DIP | 4.75 V ~ 5.25 V | 4 | Binary Full Adder with Fast Carry | ||
|
|
|
获得报价 |
2,309
有现货
|
ON Semiconductor | IC GENERATOR LOOK-AHEAD 16-DIP | 74S | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-DIP | 4.75 V ~ 5.25 V | 4 | Look-ahead Carry Generator | ||
|
|
|
获得报价 |
2,084
有现货
|
ON Semiconductor | IC ADDER BIN W/CARRY 4BIT 16-DIP | 74LS | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-DIP | 4.75 V ~ 5.25 V | 4 | Binary Full Adder | ||
|
|
|
获得报价 |
1,785
有现货
|
ON Semiconductor | IC ADDER BINARY 4BIT 16-DIP | 74LS | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-DIP | 4.75 V ~ 5.25 V | 4 | Binary Full Adder with Fast Carry | ||
|
|
|
获得报价 |
3,386
有现货
|
ON Semiconductor | IC DECODER/DRIVER BCD-DEC 16-DIP | 7400 | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-DIP | 4.75 V ~ 5.25 V | - | BCD to Decimal Decoder/Driver | ||
|
|
|
获得报价 |
1,871
有现货
|
NXP USA Inc. | IC BINARY FULL ADDER 4BIT 16DIP | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-DIP | 4.5 V ~ 5.5 V | 4 | Binary Full Adder with Fast Carry | ||
|
|
|
获得报价 |
3,533
有现货
|
NXP USA Inc. | IC ASYNC BUS ARBITER 16-DIP | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-DIP | 4.5 V ~ 5.5 V | 4 | Bus Arbiter | ||
|
|
|
获得报价 |
2,547
有现货
|
Texas Instruments | IC DIG PLL FILTER 16-DIP | 74LS | Active | Tube | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-PDIP | 4.75 V ~ 5.25 V | - | Digital Phase-Locked-Loop Filters | ||
|
|
|
获得报价 |
3,259
有现货
|
Texas Instruments | IC SYNC 6BIT BIN RATE MULT 16DIP | 7400 | Active | Tube | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-PDIP | 4.75 V ~ 5.25 V | 6 | Binary Rate Multiplier | ||
|
|
获得报价 |
1,298
有现货
|
Texas Instruments | IC 16-BIT BUS TERM ARRAY20-DIP | 74S | Active | Tube | 0°C ~ 70°C | Through Hole | 20-DIP (0.300", 7.62mm) | 20-PDIP | - | 16 | Schottky Barrier Diode Bus-Termination Array | ||
|
|
|
获得报价 |
706
有现货
|
Texas Instruments | IC 4BIT BINARY FULL ADDER 16-DIP | 74LS | Active | Tube | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-PDIP | 4.75 V ~ 5.25 V | 4 | Binary Full Adder with Fast Carry | ||
|
|
|
获得报价 |
1,666
有现货
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | ||
|
|
|
获得报价 |
1,188
有现货
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | ||
|
|
|
获得报价 |
806
有现货
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | ||
|
|
|
获得报价 |
846
有现货
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
获得报价 |
3,810
有现货
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
获得报价 |
2,817
有现货
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | ||
|
|
|
获得报价 |
2,739
有现货
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | ||
|
|
|
获得报价 |
3,609
有现货
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | ||
|
|
|
获得报价 |
2,795
有现货
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | ||
|
|
|
获得报价 |
3,663
有现货
|
Texas Instruments | IC TRANSCEIVER 1-9BIT 24DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver |
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