- 系列 :
- 零件状态 :
- 工作温度 :
- 供应商设备包 :
16 产品
图片 | 型号 | 价格 | 数量 | 库存 | 制造商 | 描述 | 系列 | 零件状态 | 包装材料 | 工作温度 | 安装类型 | 包装/箱 | 供应商设备包 | 供电电压 | 位数 | 逻辑类型 | |
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获得报价 |
972
有现货
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
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获得报价 |
3,168
有现货
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | 74BCT | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
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获得报价 |
2,054
有现货
|
Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
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获得报价 |
846
有现货
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
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获得报价 |
3,810
有现货
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
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|
获得报价 |
1,328
有现货
|
Texas Instruments | IC SCAN TEST DEV W/OBT 24-SOIC | 74ABT | Active | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
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|
获得报价 |
1,328
有现货
|
Texas Instruments | IC SCAN TEST DEV W/OBT 24-SOIC | 74ABT | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
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|
获得报价 |
2,704
有现货
|
Texas Instruments | IC SCAN TEST DEV W/OBT 24-SOIC | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
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|
获得报价 |
962
有现货
|
Texas Instruments | IC SCAN TEST DEV/TXRX 24-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
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|
获得报价 |
3,903
有现货
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Bus Transceivers | ||
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获得报价 |
1,667
有现货
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | 74ABT | Active | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 56-TFSOP (0.240", 6.10mm Width) | 56-TSSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Bus Transceivers | ||
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|
获得报价 |
773
有现货
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | 74ABT | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 56-TFSOP (0.240", 6.10mm Width) | 56-TSSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Bus Transceivers | ||
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|
获得报价 |
1,152
有现货
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 56-TFSOP (0.240", 6.10mm Width) | 56-TSSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Bus Transceivers | ||
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|
获得报价 |
2,280
有现货
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-SSOP | 74ABT | Active | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Bus Transceivers | ||
|
|
获得报价 |
1,762
有现货
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-SSOP | 74ABT | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Bus Transceivers | ||
|
|
获得报价 |
2,470
有现货
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-SSOP | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Bus Transceivers |